Mapping three-dimensional near-field responses with reconstruction scattering-type scanning near-field optical microscopy
نویسندگان
چکیده
منابع مشابه
Three-dimensional mapping of optical near field with scattering SNOM.
Scattering-type scanning near-field optical microscopy (s-SNOM) is applied to investigate three-dimensional optical near field distribution, including both amplitude and phase information. A method analogous to the force volume mode of the atomic force microscopy (AFM) technique is adapted for the measurement. The results show high lateral resolution of tens of nanometers, and even higher verti...
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A scanning near-field optical microscope (SNOM) is a powerful tool to investigate optical effects that are smaller than Abbe’s limit. Its greatest strength is the simultaneous measurement of high-resolution topography and optical near-field data that can be correlated to each other. However, the resolution of an aperture SNOM is always limited by the probe. It is a technical challenge to fabric...
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Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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ژورنال
عنوان ژورنال: AIP Advances
سال: 2017
ISSN: 2158-3226
DOI: 10.1063/1.4984924